Integrated circuit tester with high bandwidth probe assembly

Details Integrated circuit tester with high bandwidth probe assembly Integrated circuit tester with high bandwidth probe assembly

2005-07-12

2005-07-12

Zarneke, David (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

06917210

ABSTRACT:
Described herein is a probe card assembly providing signal paths for conveying high frequency signals between bond pads of an integrated circuit (IC) and an IC tester. The frequency response of the probe card assembly is optimized by appropriately distributing, adjusting and impedance matching resistive, capacitive and inductive impedance values along the signal paths so that the interconnect system behaves as an appropriately tuned Butterworth or Chebyshev filter.

REFERENCES:
patent: 6208225 (2001-03-01), Miller
patent: 6218910 (2001-04-01), Miller
patent: 6448865 (2002-09-01), Miller
patent: 6501343 (2002-12-01), Miller
patent: 6686754 (2004-02-01), Miller
patent: WO 96/15458 (1996-05-01), None

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