Integrated circuit tester with compensation for leakage current

Details Integrated circuit tester with compensation for leakage current Integrated circuit tester with compensation for leakage current

1997-04-30

1999-12-07

Ballato, Josie

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324763, G01R 3126

Patent

active

059990082

ABSTRACT:
In an integrated circuit tester module, pin electronics circuitry supplies leakage current to a circuit node which is connected to a signal pin of a device under test. The leakage current is compensated by connecting the circuit node to a voltage source at a first potential level, supplying current to the circuit node from a second potential level, and measuring current supplied to the circuit node from the voltage source. The second potential level is selectively varied in a manner such as to reduce the current supplied from the voltage source substantially to zero. The circuit node is then disconnected from the voltage source.

REFERENCES:
patent: 3070786 (1962-12-01), MacIntyre
patent: 3978399 (1976-08-01), Chadbourne
patent: 4229703 (1980-10-01), Bustin
patent: 4763028 (1988-08-01), Henry
patent: 5493246 (1996-02-01), Anderson
patent: 5563587 (1996-10-01), Harjani

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