Integrated circuit tester and remote pin electronics therefor

Details Integrated circuit tester and remote pin electronics therefor Integrated circuit tester and remote pin electronics therefor

1986-06-20

1987-09-15

Karlsen, Ernest F.

Electricity: measuring and testing

Plural, automatically sequential tests

324158R, 371 20, G01R 3128

Patent

active

046942424

ABSTRACT:
The present invention relates, in general, to an electronic and measuirng circuits are located remotely from the test head. A low device count circuit at each pin performs the necessary high speed switching. The force and measure lines are relatively long, but the signal rates are low enough to be accurately transmitted. The only high rate signals are on lines coupled to the gates of FET switches at the test head. Thus, multiple pin, high speed testing can be accomplished using relatively small and inexpensive test heads.

REFERENCES:
patent: 3555298 (1971-01-01), Neelands
patent: 3564408 (1971-02-01), Schultz et al.
patent: 4038599 (1977-07-01), Bove et al.
Schraeder, M. W.; "Multiplexed Measuring . . ."; EDN; May 12, 1982; pp. 187-190.
Faran, Jr.; "Methods of Assignment . . ."; 1982, IEEE Test Conference; May 1982; pp. 641-647.

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