Integrated circuit tester

Details Integrated circuit tester Integrated circuit tester

1980-07-09

1982-09-07

Karlsen, Ernest F.

Electricity: measuring and testing

Plural, automatically sequential tests

324158R, G01R 1512

Patent

active

043486363

ABSTRACT:
An integrated circuit tester, comprising switching means for adjusting the logic state of the pins of a test socket to a logic state of "1" and "0" and following a debounced pulsating signal, depending on the logic function and mode of operation of the IC chip under test. Electronic detection means serve to detect the logic state of each pin which is then displayed by luminus means. A card library of IC diagrams provides a diagram for each IC chip that can be tested by the invention with pin numbers, supported adjacent to the luminous display means, so that the significance of each pin is clearly demonstrated. The whole or part of the chip under test is detected as faulty if the pattern of the luminous display with the pulsating signal connected to predetermined input pins, does not obey the predetermined operation of the chip under test.
The tester also provides extentions so that the pins of the test socket may be connected to a breadboarding strip and to in circuit operating IC chips.

REFERENCES:
patent: 3870953 (1975-03-01), Boatman et al.

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