Integrated circuit test system

Details Integrated circuit test system Integrated circuit test system

1993-11-01

1995-11-21

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324758, 324725, 324 731, G01R 1073

Patent

active

054690722

ABSTRACT:
An integrated circuit test system provides a quick change flexible circuit membrane (214). The flexible circuit membrane is a quadrant based design which allows steep launch angles away from a rectangular die under test (112). The flexible circuit membrane is edge guided (308,309) for positioning and concentric alignment in a probe tooling fixture (212). The system may include a focusing force member (528) focusing force only at the test point locations in line with the die pad contact positions (512) which allows greater force to be concentrated on the contact area, and helps to alleviate the debris tracking or "dust mop" effect. Additionally, a relieved area (620) may be provided on the pressure applicator (616) to prevent membrane droop or the pillowing effects.

REFERENCES:
patent: 4980637 (1990-12-01), Huff
patent: 5148103 (1992-09-01), Pasiecznik, Jr.
patent: 5180977 (1993-01-01), Huff
patent: 5264787 (1993-11-01), Woith
Dennis J. Genin et al., "Probing Considerations in C-4 Testing of IC Wafers," ICMCM Proceedings, 1992, pp. 124-128.
Cascade.TM. Microtech, 1994, "RFIC Membrane Probe" brochure.

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