Integrated circuit test system

Details Integrated circuit test system Integrated circuit test system

1991-04-05

1992-09-08

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

371 221, G01R 3128

Patent

active

051461617

ABSTRACT:
A programmable clamping circuit is operated under the control of a tester comparator/driver circuit used to test the bi-directional input/output pins of an integrated circuit. The clamping circuit is operated during the floating or tri-state mode of operation of the pin undergoing test to clamp the potential on the input/output pin to a pre-determined voltage during any floating or tri-state mode in the test signal pattern. Control of the clamping circuit is effected in synchronism with the operation of the tester comparator/driver circuit.

REFERENCES:
patent: 4336495 (1982-06-01), Hapke
patent: 4504783 (1985-03-01), Zasio et al.
patent: 5012185 (1991-04-01), Ohfuji
patent: 5034687 (1991-07-01), Huang et al.

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