Integrated circuit test socket having toggle clamp lid

Details Integrated circuit test socket having toggle clamp lid Integrated circuit test socket having toggle clamp lid

1995-12-19

1997-07-15

Abrams, Neil

Electrical connectors

With coupling movement-actuating means or retaining means in...

For dual inline package

439 73, H01R 1362

Patent

active

056477562

ABSTRACT:
A test socket for integrated circuits includes a lid having a pressure pad which may move independently of the lid. The pressure pad is operated by a lever creating a large mechanical advantage and is provided to apply a large normal force to an integrated circuit in the test socket after the lid is closed to ensure good electrical contact between the integrated circuit device and the contact pins of the test socket.

REFERENCES:
patent: 4456318 (1984-06-01), Shibata et al.
patent: 4554505 (1985-11-01), Zachry
patent: 5176524 (1993-01-01), Mizuno et al.
patent: 5247250 (1993-09-01), Rios
patent: 5308256 (1994-05-01), Tonooka et al.
patent: 5320551 (1994-06-01), Mori et al.
patent: 5364284 (1994-11-01), Tohyama et al.

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