Integrated circuit test socket having compliant lid and mechanic

Details Integrated circuit test socket having compliant lid and mechanic Integrated circuit test socket having compliant lid and mechanic

1996-07-17

1998-08-04

Nguyen, Khiem

Electrical connectors

With coupling movement-actuating means or retaining means in...

For dual inline package

439358, H01R 1362

Patent

active

057885265

ABSTRACT:
A test socket for integrated circuits includes a base, a lid, and a latch providing a mechanical advantage. The base includes a nest which may move translationally and rotationally relative to the base. The nest is biased upward by coil springs mounted in the base. Spring-loaded contact pins extend through the base and the nest to make electrical connections between the integrated circuit and a circuit board to which the test socket is attached. The base also includes a nest support mounted below the nest to limit the downward travel of the nest to a selected distance. Furthermore, the nest has legs which connect to the base in a manner that limits upward travel to a selected distance. The lid includes a pressure pad which may move translationally relative to the lid. The pressure pad is spring-loaded by means of a flat spring contacting a ramp formed on the top side of the pressure pad in an inverted V-shape. The pressure pad can move vertically within the lid, thereby accommodating varied integrated circuit thicknesses. A link is pivotally attached at one end to the lid and at the other end to a latch for securing the lid in a closed position. The link provides a significant mechanical advantage in forcing the lid downward and closed to ensure good electrical contact between the integrated circuit device and the contact pins of the test socket.

REFERENCES:
patent: 4378139 (1983-03-01), Griffin et al.
patent: 5247250 (1993-09-01), Rios
patent: 5306167 (1994-04-01), Nagumo

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