Integrated circuit test socket

Details Integrated circuit test socket Integrated circuit test socket

2006-09-19

2006-09-19

Vu, Hien (Department: 2833)

Electrical connectors

With coupling movement-actuating means or retaining means in...

For dual inline package

C439S070000

Reexamination Certificate

active

07108535

ABSTRACT:
A test socket is provided for use in testing integrated circuits, especially integrated circuits in BGA packages. The test socket comprises a base member and a cover member configured to move vertically between an upper position and a lower position with respect to the base member. Springs are positioned between the base member and the cover member and configured to bias the cover member in the upper position. A lever is coupled to the base member and to the cover member and is configured to pivot to an open position when the cover member is in the lower position and to pivot to a closed position to confine an integrated circuit within the base member when the cover member is in the upper position.

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patent: 2004-325393 (2004-11-01), None

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