Integrated circuit test socket

Details Integrated circuit test socket Integrated circuit test socket

1988-08-19

1990-10-09

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, 324158P, B01R 102, B01R 104

Patent

active

049623567

ABSTRACT:
Improved performance and reliability is obtained in test sockets for integrated circuits (ICs). Sufficient over-travel is provided to prevent pinching when the IC and its carrier are inserted in the test socket and the lid is latched closed. A power operated piston applies controllable and uniform pressure to force the IC leads onto contact pins in the test socket base. This controllable and uniform pressure prevents gouged IC leads, bent test socket pins, and other damage that prevents proper electrical and mechanical contact between IC leads and contact pins resulting in erroneous indications of faulty IC operation.

REFERENCES:
patent: 2794444 (1957-06-01), Markey
patent: 3243993 (1966-04-01), Jacobsen
patent: 3260435 (1966-07-01), Jacobsen
patent: 3341099 (1967-09-01), Jacobsen
patent: 3970934 (1976-07-01), Akou
patent: 4031741 (1977-06-01), Schaming
patent: 4104696 (1978-08-01), Cochran, Jr.
patent: 4536051 (1985-08-01), Smith et al.
patent: 4694245 (1987-09-01), Frommes
patent: 4812754 (1989-03-01), Tracy et al.
patent: 4829241 (1989-05-01), Maelzer

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