Integrated circuit test site

Details Integrated circuit test site Integrated circuit test site

1985-05-06

1987-10-13

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 73PC, 324158P, G01R 3102

Patent

active

047001321

ABSTRACT:
An integrated circuit test site assembly for testing pin grid array (PGA) packaged integrated circuits having removable contact pins. The removable contact pins, which are preferably spring-loaded pogo pins, enable the test site assembly to be repaired quickly and easily with a minimum of down time. In addition, the test site need only be loaded with the number of pins required to make contact with the PGA lead pattern.

REFERENCES:
patent: 3701964 (1972-10-01), Cronin
patent: 4061969 (1977-12-01), Dean
patent: 4115735 (1978-09-01), Stanford
patent: 4352061 (1982-09-01), Matrone
patent: 4438397 (1984-03-01), Katz
patent: 4477774 (1984-10-01), Revirieux
patent: 4504783 (1985-03-01), Zasio et al.
patent: 4508405 (1985-04-01), Damon et al.
patent: 4573009 (1986-02-01), Fowler et al.

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