Integrated circuit test probe

Details Integrated circuit test probe Integrated circuit test probe

2006-09-19

2006-09-19

Nguyen, Vincent Q. (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Distributive type parameters

C324S600000, C324S765010, C324S072500

Reexamination Certificate

active

07109725

ABSTRACT:
A method and apparatus for testing integrated circuits by subjecting the circuits to an electromagnetic disturbance. A probe is provided, equipped with a horn cover designed to be applied to a printed circuit on which an integrated circuit is mounted. Within this horn cover, a core shield channels the electrical field that is deployed in a zone in which connections from the integrated circuit to the printed circuit that it carries are situated. The effectiveness of the electromagnetic interference injected in the integrated circuit is increased to the point that a true measurement of the resistance of this integrated circuit to the electromagnetic interferences may be carried out.

REFERENCES:
patent: 6121779 (2000-09-01), Schutten et al.
patent: 6411105 (2002-06-01), Liu
patent: 2002/0047722 (2002-04-01), Cook et al.
patent: WO 00/72030 (2000-11-01), None

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