Thermal measuring and testing – Temperature measurement – Composite temperature-related paramenter
Reexamination Certificate
2007-05-18
2009-12-15
Allen, Andre J (Department: 2855)
Thermal measuring and testing
Temperature measurement
Composite temperature-related paramenter
C323S315000
Reexamination Certificate
active
07632011
ABSTRACT:
Systems and methods disclosed herein provide temperature monitoring within an integrated circuit. For example, in accordance with an embodiment of the present invention, a bandgap reference circuit provides a reference voltage; a constant current generator provides a constant current; and a reference signal circuit receives the reference voltage and provides a reference signal having a selectable value based on the reference voltage. A bipolar diode receives the constant current and provides a sense signal, with a value of the sense signal corresponding approximately to a temperature value of the integrated circuit. A comparator receives the sense signal and the reference signal and provides a temperature sensor output signal.
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Lall, U.S. Appl. No. 12/099,933, filed Apr. 9, 2008.
Green Nathan
Lall Ravindar M.
Allen Andre J
Haynes and Boone LLP
Lattice Semiconductor Corporation
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