Integrated circuit temperature sensing method

Miscellaneous active electrical nonlinear devices – circuits – and – External effect – Temperature

Reexamination Certificate

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C374S178000

Reexamination Certificate

active

07459955

ABSTRACT:
A method and system for sensing the temperature of an integrated circuit are presented. The method compares a first current that is proportional to a temperature reading of the integrated circuit to a reference current. While the first current is greater than the reference current, a counter is incremented, and the reference current is increased in response to incrementing the counter. A system for sensing the temperature of an integrated circuit includes a first current source providing a source current to a node. The first current source is based on an input from a proportional to absolute temperature device. The system also includes a second current source providing a sink current to the node, with the amount of sink current being based on an input from a digital control module. The system also includes a comparator coupled to the node to provide a comparator signal that indicates a relationship between the source current and the sink current.

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patent: 7212064 (2007-05-01), Schnaitter

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