Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-04-03
2007-04-03
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S755090
Reexamination Certificate
active
10959620
ABSTRACT:
An apparatus may include a body to couple to a motherboard, the body defining an opening, and a support removably coupled to the body, the support to mount in the opening and to pass electrical interconnects to electrically couple an integrated circuit to the motherboard. In further aspects, an apparatus may include a plurality of electrical interconnects disposed in respective ones of a plurality of openings of the support, the plurality of electrical interconnects to electrically couple an integrated circuit to the motherboard, a base mounted on the body, the base defining base openings to pass the plurality of electrical interconnects, wherein the base is to receive the integrated circuit and to move toward the support so as the bring electrical contacts of the integrated circuit into contact with the plurality of electrical interconnects.
REFERENCES:
patent: 5727954 (1998-03-01), Kato et al.
patent: 5907246 (1999-05-01), Abraham et al.
patent: 6541991 (2003-04-01), Hornchek et al.
patent: 6776624 (2004-08-01), Suematsu
patent: 2005/0225315 (2005-10-01), Goldsmith et al.
Batara Walter Jay
Lam Kok Wei (Harrick)
Buckley Maschoff & Talwalkar LLC
Intel Corporation
Tang Minh N.
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