Integrated circuit probing apparatus

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324158P, 324 73PC, 324 725, G01R 3102, G01R 106

Patent

active

048719641

ABSTRACT:
A device for measuring the performance of high speed integrated circuits (ICs) while in wafer form consists of one or more miniature coaxial transmission lines for carrying the test signals to and from test instruments. Each of the miniature coaxial cables has a standard connector at one end for connection to testing instruments. The other end of each cable has its center conductor extended beyond the shield of the cable and formed into a conical point for connection to test pads on the IC. One or more miniature leaf springs are attached to the shield. The leaf springs are adapted so that during a probing operation they contact the test pads first and thereafter flex to allow the center conductors to make contact to other test pads. The miniature coaxial transmission lines also flex to limit forces which could otherwise damage center conductors or the test pads.

REFERENCES:
patent: 3445770 (1969-05-01), Harmon
patent: 3812311 (1974-05-01), Kvaternik
patent: 3826984 (1974-07-01), Epple
patent: 3832632 (1974-08-01), Ardezzone
patent: 3849728 (1974-11-01), Evans
patent: 4116523 (1979-09-01), Coberly et al.
patent: 4161692 (1979-07-01), Tarzwell
patent: 4382228 (1983-05-01), Evans
patent: 4439809 (1984-03-01), Weight et al.
patent: 4473798 (1984-09-01), Cedrone
patent: 4480223 (1984-10-01), Aigo et al.
patent: 4593243 (1986-06-01), Lao et al.
patent: 4599599 (1986-07-01), Evans
patent: 4636722 (1987-01-01), Ardezzone
patent: 4697143 (1987-09-01), Lockwood et al.
patent: 4727319 (1988-02-01), Shahriary
patent: 4749942 (1988-06-01), Sang et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Integrated circuit probing apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Integrated circuit probing apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated circuit probing apparatus will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-666601

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.