Integrated circuit probe card inspection system

Details Integrated circuit probe card inspection system Integrated circuit probe card inspection system

1993-06-04

1997-08-12

Mancuso, Joseph

Image analysis

Applications

Manufacturing or product inspection

382152, G06K 900

Patent

active

056573944

ABSTRACT:
A system for inspecting integrated circuit probe cards using a video camera positioned to view probe points on the cards from below. A precision movement stage is used to move the video camera into a known position for viewing the probe points. Analysis of the video image and the stage position are used to determine the relative positions of the probe points.

REFERENCES:
patent: 3835381 (1974-09-01), Garretson et al.
patent: 3849728 (1974-11-01), Evans
patent: 3905008 (1975-09-01), Hagemann
patent: 4161692 (1979-07-01), Tarzwell
patent: 4382228 (1983-05-01), Evans
patent: 4554506 (1985-11-01), Faure et al.
patent: 4599559 (1986-07-01), Evans
patent: 4757256 (1988-07-01), Whann et al.
patent: 4812901 (1989-03-01), Karasawa
patent: 4831316 (1989-05-01), Ishiguro et al.
patent: 4843315 (1989-06-01), Bayer et al.
patent: 4855928 (1989-08-01), Yamanaka
patent: 4918374 (1990-04-01), Stewart et al.
patent: 4919374 (1990-04-01), Julian
patent: 4929893 (1990-05-01), Sato et al.
patent: 5060371 (1991-10-01), Stewart et al.
patent: 5119436 (1992-06-01), Holdgrafer
patent: 5274713 (1993-12-01), Chang et al.
patent: 5280436 (1994-01-01), Kubota et al.

Affiliated with

Also associated with

Rating

Integrated circuit probe card inspection system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Integrated circuit probe card inspection system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated circuit probe card inspection system will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-166973