Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-04-05
2005-04-05
Pert, Evan (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB, C324S754090
Reexamination Certificate
active
06876216
ABSTRACT:
An integrated circuit probe card comprises a circuit board and a plurality of probes provided with a first pitch between them. The circuit board is constituted by a plurality of laminates and comprises an upper surface and a bottom surface a plurality of testing pads provided on the upper surface with a second pitch between them. Besides, the circuit board can further comprise a plurality of electronic devices provided on the upper surface for processing signals. The plurality of testing pads are connected to the bottom surface by the use of the plurality of conductive wires. The plurality of probes are provided wits a first pitch and connected to the conductive wire on the bottom surface of the circuit board, wherein the first pitch is smaller than the second pitch.
REFERENCES:
patent: 3806801 (1974-04-01), Bove
patent: 3963986 (1976-06-01), Morton et al.
patent: 6246245 (2001-06-01), Akram et al.
patent: 6552555 (2003-04-01), Nuytkens et al.
Connolly Bove & Lodge & Hutz LLP
Hume Larry J.
MJC Probe Incorporation
Nguyen Jimmy
Pert Evan
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