Semiconductor device manufacturing: process – With measuring or testing – Packaging or treatment of packaged semiconductor
Reexamination Certificate
2010-06-02
2011-10-18
Sefer, A. (Department: 2893)
Semiconductor device manufacturing: process
With measuring or testing
Packaging or treatment of packaged semiconductor
C257S737000
Reexamination Certificate
active
08039275
ABSTRACT:
A method of manufacture of an integrated circuit packaging system includes: forming a rounded interconnect on a package carrier having an integrated circuit attached thereto; placing a mold chase having a protrusion over the rounded interconnect; forming an encapsulation over the package carrier, the encapsulation having a recess under the protrusion; removing the mold chase to expose the encapsulation; and removing the encapsulation under the recess for exposing the rounded interconnect.
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Bae JoHyun
Cho Sung-Won
Choi Dae-Sik
Harrison Monica D
Ishimaru Mikio
Sefer A.
Stats Chippac Ltd.
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