Integrated circuit package burn-in socket linkage system

Electrical connectors – With coupling movement-actuating means or retaining means in... – Including compound movement of coupling part

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Details

439331, H01R4/50

Patent

active

059021446

ABSTRACT:
A test socket for an integrated circuit package. The test socket includes a latch arm that is pivotally connected to a socket base so that the arm can move between an open position and closed position. The socket also has a spring that is attached to the base and a cover. The latch arm is pivotally connected to the cover by a linkage arm. An actuator pushes down on the cover and rotates the latch arm to an open position so that an integrated circuit package can be inserted into the socket. Movement of the cover also pushes the spring into a deflected position. When the cover is released, the potential energy of the deflected spring is transferred through the link and rotates the latch arm back to the closed position. The force of the spring is transferred to the latch arm to push the integrated circuit package into a plurality of electrical contacts of the socket.

REFERENCES:
patent: 5493237 (1996-02-01), Volz et al.
patent: 5629836 (1997-05-01), Wright

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