Integrated circuit memory with fast page mode verify

Details Integrated circuit memory with fast page mode verify Integrated circuit memory with fast page mode verify

2006-12-19

2006-12-19

Phung, Anh (Department: 2824)

Static information storage and retrieval

Floating gate

Particular biasing

C365S185220, C365S200000

Reexamination Certificate

active

07151694

ABSTRACT:
A method for operating an integrated circuit memory device includes applying a verify procedure in which the page of data and one or more bits from a set of replacement cells are matched with a pattern in parallel to indicate a verify result, where the page of data is “unrepaired” and may include one or more bits from defective bit lines. While matching to indicate a verify result, the one or more bits from defective bit lines in the page are masked. Flash memory and other memory devices implement the method.

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