Integrated circuit manufacture

Details Integrated circuit manufacture Integrated circuit manufacture

1984-04-26

1987-02-10

Wise, Edward J.

Boots, shoes, and leggings

364580, 371 26, G06F 1100

Patent

active

046427848

ABSTRACT:
Proven data base is generated for electrical test responses of sporadic defects in integrated circuits as manufactured. Manufactured circuits are subjected to that electrical testing and resulting responses used to identify defect and check the manufacture to avoid its repetition.

REFERENCES:
patent: 4168527 (1979-09-01), Winkler
patent: 4484329 (1984-11-01), Slamka et al.
"Automated Analysis of Dynamic RAM Functional Failures", Kuban & Holmes 1980 IEEE Test Conference, Paper 9.1, pp. 221-224.
"Pattern Recognition of Bit Fail Maps", Faucher, 1983 IEEE Test Conference, Paper 16.1, pp. 460-463.

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