Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated...
Reexamination Certificate
2006-08-01
2006-08-01
Pham, Hoai (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Integrated circuit structure with electrically isolated...
C257S501000
Reexamination Certificate
active
07084476
ABSTRACT:
An integrated circuit (IC) including at least one combinational logic path. The combinational logic path includes two types of logic blocks cells that compensate each other for fabrication parameter effects on cell transistors. The two types may be dense cells with field effect transistor (FET) gates on contacted pitch and isolated cells with FET gates on wider than contacted pitch. Dense cell delay changes from the FET gates being printed out of focus are offset by isolated cell delay changes.
REFERENCES:
patent: 5563012 (1996-10-01), Neisser
patent: 6871338 (2005-03-01), Yamauchi
patent: 2002/0030510 (2002-03-01), Kono et al.
patent: 2004/0208266 (2004-10-01), Lenosky
Orshansky et al., A General Proabalistic Framework for Worst Case Timing Analysis, DAC 2002, Jun. 10, 2002, pp. 556-561, Published in: New Orleans, LA.
Gupta Puneet
Heng Fook-Luen
Kung David S.
Ostapko Daniel L.
Ha Nathan W.
International Business Machines Corp.
Karra, Esq. Satheesh K.
Law Office of Charles W. Peterson, Jr.
Percello, Esq. Louis J.
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