Electricity: measuring and testing – Plural – automatically sequential tests
Patent
1990-06-22
1991-12-03
Wieder, Kenneth A.
Electricity: measuring and testing
Plural, automatically sequential tests
324158R, 324537, 371 151, G01R 3100
Patent
active
050702963
ABSTRACT:
A test system for determination of the integrity of interconnections between integrated circuits based on test circuit portions provided in such integrated circuits which are subject to signals from the inputs that might vary in value because of faulty interconnections. The values on such inputs are set, in the absence of input signals reaching them, by switchable resistances in the corresponding test circuit portions each of which can couple a predetermined signal value to a corresponding input, but which can also be overridden by signals supplied to that input across the corresponding interconnection from a source thereof.
REFERENCES:
patent: 3801905 (1974-04-01), Baker et al.
patent: 4395767 (1983-07-01), Van Brunt et al.
patent: 4638246 (1987-01-01), Blank et al.
patent: 4742293 (1988-05-01), Koo et al.
patent: 4743841 (1988-05-01), Takeuchi
patent: 4791359 (1988-12-01), Raymond et al.
patent: 4812742 (1989-03-01), Abel et al.
patent: 4857833 (1989-08-01), Gonzalez et al.
patent: 4894605 (1990-01-01), Ringleb et al.
patent: 4904883 (1990-02-01), Iino et al.
patent: 4914379 (1990-04-01), Maeno
Honeywell Inc.
Neils Theodore F.
Nguyen Vinh P.
Wieder Kenneth A.
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