Integrated circuit input/output ESD protection circuit with gate

Electricity: electrical systems and devices – Safety and protection of systems and devices – High voltage dissipation

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361 56, 361 91, 361111, H02H 100

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active

058153608

ABSTRACT:
An integrated circuit structure with input/output gate voltage regulation and parasitic zener and junction diodes for protection against damage resulting from electrostatic discharge (ESD) events. The circuit includes a first protective FET connected between an input/output pad and a ground potential of the integrated circuit. A diode voltage regulator is also connected between the gate of the first protective FET and a reference potential of the integrated circuit. The first protective FET receives a voltage from its gate-drain overlap capacitance during an ESD event. The diode is operative during an ESD event to provide a sufficient voltage to the first FET gate to permit a desired ESD current flow through the first protective FET. In one embodiment the first FET is an NMOS device and the diode voltage regulator is a series of p-n forward biased diodes.

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Charvaka Duvvury and Carlos Diaz, "Dynamic Gate Coupling of NMOS for Efficient Output ESD Protection," IEEE Proceedings of the IRP, Sanvary, 1992, pp. 141-150.

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