Integrated circuit including silicide region to inhibit...

Active solid-state devices (e.g. – transistors – solid-state diode – With metal contact alloyed to elemental semiconductor type... – In bipolar transistor structure

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S112000, C257S197000, C257S288000, C257S377000, C257S382000, C257S384000, C257S454000, C257S474000, C257S486000, C257S511000

Reexamination Certificate

active

07863610

ABSTRACT:
An integrated circuit is disclosed. One embodiment includes a first diode, a second diode, and a semiconductor line coupled to the first diode and the second diode. The line includes a first silicide region between the first diode and the second diode.

REFERENCES:
patent: 6274908 (2001-08-01), Yamaguchi et al.
patent: 6972211 (2005-12-01), Hsu et al.
patent: 7193267 (2007-03-01), Hsu et al.
patent: 2008/0315171 (2008-12-01), Happ et al.
patent: 2009/0052230 (2009-02-01), Rajendran et al.
patent: 2009/0132781 (2009-05-01), Schnepper

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Integrated circuit including silicide region to inhibit... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Integrated circuit including silicide region to inhibit..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated circuit including silicide region to inhibit... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2731760

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.