Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2011-08-23
2011-08-23
Lebentritt, Michael S (Department: 2829)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S004000, C257S257000, C257S268000, C257SE21647, C257SE21669, C257SE23145, C257SE23149, C257SE45002
Reexamination Certificate
active
08003971
ABSTRACT:
An integrated circuit includes a first electrode, a second electrode, and a damascene structured memory element coupled to the first electrode and the second electrode. The memory element has a height and a width. The height is greater than or equal to the width. The memory element includes resistance changing material doped with dielectric material.
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Happ Thomas
Philipp Jan Boris
Dicke Billig & Czaja, PLLC
Lebentritt Michael S
Qimonda AG
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