Electricity: measuring and testing – Magnetic – Magnetometers
Reexamination Certificate
2007-08-27
2009-10-06
Aurora, Reena (Department: 2862)
Electricity: measuring and testing
Magnetic
Magnetometers
C324S207210, C324S235000
Reexamination Certificate
active
07598736
ABSTRACT:
An integrated circuit includes two first adjacent magneto-resistive effect (xMR) structures. Each first xMR structure is configured to sense a first magnetic field direction. The integrated circuit includes two second adjacent xMR structures at a distance from the two first xMR structures. Each second xMR structure is configured to sense a second magnetic field direction. The two first xMR structures and the two second xMR structures are configured for in-plane magnetic field components perpendicular to the first magnetic field and the second magnetic field and phase shifted by approximately 90° from the first magnetic field and the second magnetic field acting on the two first xMR structures and the two second xMR structures.
REFERENCES:
patent: 5796249 (1998-08-01), Andräet et al.
patent: 6246233 (2001-06-01), Griffen et al.
patent: 6300758 (2001-10-01), Griffen et al.
patent: 2001/0009367 (2001-07-01), Seitzer et al.
patent: 2005/0258820 (2005-11-01), Forster
Prügl Klemens
Zimmer Jürgen
Aurora Reena
Dicke Billig & Czaja, PLLC
Infineon - Technologies AG
LandOfFree
Integrated circuit including magneto-resistive structures does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Integrated circuit including magneto-resistive structures, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated circuit including magneto-resistive structures will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4055586