Integrated circuit including magneto-resistive structures

Electricity: measuring and testing – Magnetic – Magnetometers

Reexamination Certificate

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C324S207210, C324S235000

Reexamination Certificate

active

07598736

ABSTRACT:
An integrated circuit includes two first adjacent magneto-resistive effect (xMR) structures. Each first xMR structure is configured to sense a first magnetic field direction. The integrated circuit includes two second adjacent xMR structures at a distance from the two first xMR structures. Each second xMR structure is configured to sense a second magnetic field direction. The two first xMR structures and the two second xMR structures are configured for in-plane magnetic field components perpendicular to the first magnetic field and the second magnetic field and phase shifted by approximately 90° from the first magnetic field and the second magnetic field acting on the two first xMR structures and the two second xMR structures.

REFERENCES:
patent: 5796249 (1998-08-01), Andräet et al.
patent: 6246233 (2001-06-01), Griffen et al.
patent: 6300758 (2001-10-01), Griffen et al.
patent: 2001/0009367 (2001-07-01), Seitzer et al.
patent: 2005/0258820 (2005-11-01), Forster

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