Integrated circuit having self-testing function

Details Integrated circuit having self-testing function Integrated circuit having self-testing function

1994-11-08

1997-04-08

Beausoliel, Jr., Robert W.

Excavating

371 251, 371 211, 371 27, G06F 1100

Patent

active

056195125

ABSTRACT:
A semiconductor device capable of inspecting itself efficiently. Output data from a circuit under test is supplied to a testing data-generating circuit and a non-periodic function transformation is performed so that testing data generated by the testing data generating circuit has a pseudo-random pattern. This pseudo-random pattern is fed back to the circuit under test to continue self-testing. This test is repeated a predetermined number of times that is sufficient to finish all tests for checking the circuit under test. A mathematical function having non-periodic solutions can be realized by a simple rearrangement of various conductive lines so that is is not necessary to previously prepare patterns of testing data.

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