Integrated circuit having logic circuits with latch elements con

Details Integrated circuit having logic circuits with latch elements con Integrated circuit having logic circuits with latch elements con

1990-10-09

1992-06-16

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158T, 371 211, 371 221, G01R 3128

Patent

active

051227380

ABSTRACT:
A digital data storage circuit for a digital signal processor which is capable of receiving asynchronous inputs and is such as to be testable by selectively configuring the storage circuits as a shift register enabling the entry and extraction of test data into the processor. The storage circuit includes two latch elements each formed by two complementary transistor inverter circuits connected in a positive feedback arrangement and in which the output current capability of the second inverter circuit is restricted to enable the latch element to change state in response to input signals applied to it. Asynchronous inputs are applied to a first latch element through switch means comprising a complementary transistor inverter responsive to a SET input in series with a transistor responsive to a CLEAR input. The complementary inverter is connected to the input of the first latch element through a series connected transistor. During testing the series connected transistor is blocked and the first latch element is connected in a two elements per bit shift register configuration with the second latch element by series connected transistors controlled by antiphase square waves.

REFERENCES:
patent: 4580137 (1986-04-01), Fiedler et al.
patent: 4602210 (1986-07-01), Fasang et al.
patent: 4698588 (1987-10-01), Hwang et al.
patent: 4856002 (1989-08-01), Sakashita et al.

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