Integrated circuit having input and output terminals for testing

Details Integrated circuit having input and output terminals for testing Integrated circuit having input and output terminals for testing

1985-09-06

1987-11-17

Karlson, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 73R, C01R 3128

Patent

active

047076542

ABSTRACT:
An integrated circuit is constructed in order that tests can be conducted on a plurality of circuits to determine which of the circuits is defective. In particular, the circuit is constructed to allow such testing with the use of fewer input and output pins for testing. To accomplish this, a first buffer gate circuit, a resistor, and a second buffer gate are connected in series in the order mentioned between the output terminal of a first circuit and the input terminal of a second circuit. An input and output terminal pin for testing is located at a junction point of the resistor and second buffer gate.

REFERENCES:
patent: 3183446 (1965-05-01), Richman
patent: 3363177 (1968-01-01), Houghton
patent: 3590340 (1971-06-01), Kubo et al.
patent: 4025871 (1977-05-01), Peil

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