Integrated circuit having independently testable input-output ci

Details Integrated circuit having independently testable input-output ci Integrated circuit having independently testable input-output ci

1997-05-28

1999-08-10

Ton, My-Trang Nu

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Particular stable state circuit

327401, H03K 3295

Patent

active

059364483

ABSTRACT:
An integrated circuit in which Schmitt input circuits can be tested in a short time and a highly accurate test result can be obtained. The integrated circuit includes switches each passing outputs of Schmitt inverters with inputs connected to input-output ports to the inputs of tristate circuits with outputs connected to adjacent input-output ports. The outputs of the Schmitt inverters may be blocked by the switches from being passed to internal logical circuits. A switch passes the output of the Schmitt inverter to the adjacent tristate circuit during the test of the Schmitt inverter. Alternately, each half of the Schmitt inverters can be tested as predetermined control signals selectively control each switch and each tristate circuit.

REFERENCES:
patent: 5479607 (1995-12-01), Tasaki et al.

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