Integrated circuit having capacitive process-scatter compensatio

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons

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307482, 307578, 307279, 307585, H03K 3356, H03K 458, H03K 1714, H03K 1716

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active

047758066

ABSTRACT:
In integrated circuits the delay of the signal transitions has to lie within specified limits. This delay is partly determined by variations in the manufacturing process (process scatter). To compensate for the effect of this scatter a load capacitance is connected via a switching element to a node which is to be influenced in the integrated circuit. The switching element receives a reference voltage which is dependent on the manufacturing process and is generated by reference source, so that the node capacitance 26 is connected to the node for a longer or shorter time, depending on the process scatter.

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patent: 4567381 (1986-01-01), Piasecki
patent: 4649291 (1987-03-01), Konishi
patent: 4677314 (1987-06-01), Shirato et al.
Fink et al, Electronics Engineers' Handbook, pp. 16-15 to 16-18, McGraw-Hill, 1982.

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