Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2005-10-27
2009-11-10
Chen, Jack (Department: 2893)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S004000, C257SE21003
Reexamination Certificate
active
07615770
ABSTRACT:
A memory cell includes a first electrode, a second electrode, and phase-change material between the first electrode and the second electrode. The phase-change material defines a narrow region. The memory cell includes first insulation material having a first thermal conductivity and contacting the phase-change material. A maximum thickness of the first insulation material contacts the narrow region. The memory cell includes a second insulation material having a second thermal conductivity greater than the first thermal conductivity and contacting the first insulation material.
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Bergmann Renate
Happ Thomas
Philipp Jan Boris
Chen Jack
Dicke Billig & Czaja, PLLC
Infineon - Technologies AG
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