Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-05-30
2009-06-23
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S538000
Reexamination Certificate
active
07552016
ABSTRACT:
An integrated circuit includes a monitor node adapted to receive a monitored signal. The integrated circuit also includes a multi-purpose node. The integrated circuit is adapted to receive and store a threshold presented at the multi-purpose node during a first time period. The integrated circuit is also adapted to output a fault signal from the multi-purpose node at a time after the predetermined time period. The fault signal is indicative of a relationship between the monitored signal and the threshold. With this arrangement, the multi-purpose node achieves at least two functions.
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Cummings John
Haas David J.
Lamarre Jonathan
Vig Ravi
Allegro Microsystems Inc.
Bui Bryan
Daly, Crowley & Mofford & Durkee, LLP
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