Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – With auxiliary means to condition stimulus/response signals
Reexamination Certificate
2006-09-05
2006-09-05
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
With auxiliary means to condition stimulus/response signals
C324S763010, C714S718000
Reexamination Certificate
active
07102362
ABSTRACT:
An integrated circuit includes a first circuit component, a second circuit component, and an external terminal for making contact with the circuit. The first circuit component is connected to the external terminal via the second component. A bridging circuit connects the first circuit component to the external terminal and can be activated by a test mode signal. In the active state, the bridging circuit connects the external terminal to the first circuit component while bridging the second circuit component, while it is nonconducting in the deactivated state. Circuit components integrated in the semiconductor chip can be electrically measured nondestructively via activatable switches. Circuit components that lie between the external terminal and the device to be measured can be excluded from the measurement by bridging circuits. The method also makes it possible to measure a plurality of integrated devices in parallel or serially.
REFERENCES:
patent: 5844921 (1998-12-01), Bou-Ghazale et al.
patent: 6081479 (2000-06-01), Ji et al.
patent: 6346820 (2002-02-01), Yamagami
patent: 6639393 (2003-10-01), Tasker et al.
patent: 6639397 (2003-10-01), Roth et al.
patent: 6670802 (2003-12-01), Dietrich et al.
patent: 2003/0053471 (2003-03-01), Stief
patent: 2003/0201787 (2003-10-01), Manning
patent: 2005/0024075 (2005-02-01), Srivastava
patent: 2005/0099199 (2005-05-01), Sugita et al.
patent: 2005/0194980 (2005-09-01), Konig et al.
Funfrock Fabien
Sommer Michael Bernhard
Deb Anjan
Edell Shapiro & Finnan LLC
Infineon - Technologies AG
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