Integrated circuit for independently testing individual analog i

Details Integrated circuit for independently testing individual analog i Integrated circuit for independently testing individual analog i

1995-06-12

1996-10-15

Nelms, David C.

Miscellaneous active electrical nonlinear devices, circuits, and

Specific signal discriminating without subsequent control

By amplitude

327 76, 365201, 3241581, H03K 522, G11C 700

Patent

active

055658016

ABSTRACT:
Integrated circuits which process analog signals and consist of a plurality of separate functional blocks are difficult to test because the terminals of, internally interconnected functional blocks cannot be simply fed out in view of the limited number of external terminals. In order to test the integrated circuit by testing individual functional blocks separately, it is proposed to connect inputs and outputs of functional blocks are connected to switches enabling connection of these functional blocks to external terminals. The switches are controlled by storage stages which are loaded via a test input which is connected to comparators. These comparators compare the input signal with various reference voltages, the voltage ranges between the reference signals being associated with the logic values "0" and "1" as well as with a clock signal value. This enables a series of data with a data clock to be applied via only one test input in order to switch the internal switches in conformity with the desired test state.

REFERENCES:
patent: 4101839 (1978-07-01), Poole et al.
patent: 5014226 (1991-05-01), Horstmann et al.

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