Integrated circuit fault testing implementing voltage supply rai

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324522, 324765, 371 251, G01R 3100

Patent

active

054831709

ABSTRACT:
A method and apparatus for detecting faults in digital, analog, and hybrid integrated circuits is disclosed. A single test vector employing bias voltage on input used in conjunction with pulsing the power supply rails is used to allow detection of the various faults which may be present. The instantaneous rail current (i.sub.DD) is then employed for analysis of the circuit, preferably by neural network.

REFERENCES:
patent: 3803484 (1974-04-01), Gray
patent: 4630228 (1986-12-01), Tarczy-Hornoch et al.
patent: 4631724 (1986-12-01), Shimizu
patent: 4710704 (1987-12-01), Ando
patent: 4820974 (1989-04-01), Katsura et al.
patent: 4965512 (1990-10-01), DeBar et al.
patent: 5025344 (1991-06-01), Maly et al.
patent: 5049815 (1991-09-01), Kliman
patent: 5057774 (1991-10-01), Verhelst et al.
patent: 5097206 (1992-03-01), Perner
patent: 5155701 (1992-10-01), Komori et al.
patent: 5321354 (1994-06-01), Ooshima et al.
patent: 5332973 (1994-07-01), Brown et al.
J. Frenzel, et al., "Power Supply Current Signature (PSCS) Analysis: A New Approach To System Testing," 1987 International Test Conference, CH2347-2/87, pp. 125-135 (1987) (Month Unavailable).
M. Hashizume, et al., "Fault Detection of Combinational Circuits Based on Supply Current," 1988 International Test Conference, CH2610-4/88, pp. 374-380 (1988)(Month Unavailable).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Integrated circuit fault testing implementing voltage supply rai does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Integrated circuit fault testing implementing voltage supply rai, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated circuit fault testing implementing voltage supply rai will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1304861

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.