Patent
1985-10-23
1988-07-19
Wojciechowicz, Edward J.
357 40, 357 46, 357 34, 357 38, 357 50, 357 51, 357 55, 357 68, 357 86, H01L 2702
Patent
active
047588721
ABSTRACT:
For elimination of undesired leakage current, there is disclosed an integrated circuit fabricated in a semiconductor substrate of a first conductivity type which comprises at least first and second semiconductor elements, the first semiconductor element having a first impurity region of a second conductivity type formed in a surface portion of the semiconductor substrate and a second impurity region of the first conductivity type formed in the first impurity region, wherein the second impurity region is connected to the second semiconductor element by a first conductive layer extending on an insulating layer formed on the semiconductor substrate, a junction of the semiconductor substrate and the first impurity region being located under the first conductive layer.
REFERENCES:
patent: 4319257 (1982-03-01), Beasom
patent: 4405933 (1983-09-01), Avery
NEC Corporation
Wojciechowicz Edward J.
LandOfFree
Integrated circuit fabricated in a semiconductor substrate does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Integrated circuit fabricated in a semiconductor substrate, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated circuit fabricated in a semiconductor substrate will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-600410