Integrated circuit early life failure detection by...

Details Integrated circuit early life failure detection by... Integrated circuit early life failure detection by...

2005-03-29

2005-03-29

Zarneke, David (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

06873171

ABSTRACT:
A method for testing integrated circuits, including measuring a current signature delta value of a device under test and comparing the current signature delta value to a threshold current signature delta value to determine whether the current signature delta value is greater than the threshold current signature delta value. If the current signature delta value exceeds the threshold current signature delta value, the integrated circuit is rejected. Integrated circuits are also rejected if the post-stress current signature value exceeds a maximum current signature value, even though the current signature delta value is less than the threshold current signature delta value. In addition, an apparatus for testing integrated circuits is disclosed.

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Thibeault, “A Novel Probabilistic Approach for IC Diagnosis Based on Differential Quiescent Current Signatures”, 15th IEEE VLSI Test Symposium, Apr. 27-May 1, 1997, pp. 80-85.
Thibeault et al. “Diagnosis Method Based on Delta-IDDQ Probabilistic Signatures: Experimental Results”; IEEE International Test Conference, 1998 (Month Unavailable), pp. 1019-1026.
Thibeault, “On the Comparison of Delta-IDDQ and IDDQ Testing,” VLSI Test Symposium, 17th IEEE Proceedings, Apr. 25-29, 1999, pp. 143-150.
Thibeault, “Improving Delta-IDDQ-Based Test Methods”, IEEE International Test Conference Proceedings, Oct. 3-5, 2000; pp.: 207-206.

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