Integrated circuit driver inhibit control test method

Details Integrated circuit driver inhibit control test method Integrated circuit driver inhibit control test method

1990-01-25

1992-06-30

Beausoliel, Robert W.

Excavating

371 221, G06F 1100

Patent

active

051270080

ABSTRACT:
A method and apparatus for designing very large scale integrated circuit devices, most particularly level sensitive scan design (LSSD) devices, by inclusion of a plurality of distributed delay lines originating at input terminals of the device, and controlling the inhibiting and enabling of driver circuits connected to the output terminals of the device, as required to regulate operation of device drivers during a plurality of testing operations.

REFERENCES:
patent: 4782283 (1988-11-01), Zasio
patent: 4862068 (1989-08-01), Kawashima
patent: 4879718 (1989-11-01), Sanner
patent: 4931723 (1990-06-01), Jeffrey

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