Integrated circuit die including a temperature detection...

Details Integrated circuit die including a temperature detection... Integrated circuit die including a temperature detection...

2006-09-05

2006-09-05

Wells, Kenneth B. (Department: 2816)

Miscellaneous active electrical nonlinear devices, circuits, and

External effect

Temperature

C374S001000, C702S099000, C702S130000

Reexamination Certificate

active

07102417

ABSTRACT:
An integrated circuit die is disclosed including a temperature detection circuit and a memory configured to store calibration data. The temperature detection circuit is operatively coupled to the memory, and receives an input signal. The temperature detection circuit is configured to produce an output signal dependent upon the input signal and indicative of whether a temperature of the integrated circuit die is greater than a selected temperature. During a normal operating mode of the integrated circuit die the input signal comprises the calibration data. A system and methods for calibrating the temperature detection circuit are also described.

REFERENCES:
patent: 5781075 (1998-07-01), Bolton, Jr. et al.
patent: 6283628 (2001-09-01), Goodwin
patent: 6674185 (2004-01-01), Mizuta
patent: 6901349 (2005-05-01), Nagasawa
patent: 1 411 630 (2003-02-01), None
patent: 05 25 6839 (2006-02-01), None

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