Integrated circuit devices with ESD protection in scribe...

Active solid-state devices (e.g. – transistors – solid-state diode – Regenerative type switching device – Device protection

Reexamination Certificate

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Details

C257S355000, C257S618000, C257S620000, C257SE23070, C257SE27013, C257S758000

Reexamination Certificate

active

08049249

ABSTRACT:
A semiconductor wafer with an electrostatic discharge (ESD) protective device is disclosed. The semiconductor wafer includes first and second adjacent semiconductor die regions, a protective device in a scribe line region between the first and second die regions, and at least one metal line on a surface of the first die region, wherein the metal line(s) is/are in electrical communication with the protective device.

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Cheng Chuan-Cheng et al.; Integrated Circuit Devices and Systems with ESD and I/O Protection and Methods for Fabricating Same; U.S. Appl. No. 11/505,782, filed Aug. 16, 2006.
Cheng Chuan-Cheng et al; New Approach for ESD Protection; U.S. Appl. No. 60/765,968, filed Feb. 7, 2006.

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