Integrated circuit device provided with test mode function

Details Integrated circuit device provided with test mode function Integrated circuit device provided with test mode function

1990-08-24

1992-04-07

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

371 221, 371 225, G01R 3128

Patent

active

051031671

ABSTRACT:
An integrated circuit device provided with test mode function has a plurality of terminals used for receiving and/or feeding out signals during a normal operation of the device. At least one terminal of the plurality of terminals are connected to a register for storing test mode setting data applied through the at least one terminal during a reset cycle period of the device. In accordance with the test mode setting data stored in the register, a setting of a predetermined test mode of the device is executed.

REFERENCES:
patent: 4743841 (1988-05-01), Takeuchi
patent: 4816757 (1989-03-01), Hutchins

Affiliated with

Also associated with

Rating

Integrated circuit device provided with test mode function does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Integrated circuit device provided with test mode function, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated circuit device provided with test mode function will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1897885