Registers – Records – Conductive
Reexamination Certificate
2008-03-07
2011-11-22
Kim, Ahshik (Department: 2876)
Registers
Records
Conductive
C235S451000
Reexamination Certificate
active
08061621
ABSTRACT:
An integrated circuit device and method. A substrate having contacts has a plurality of capacitors thereon. A plurality of fusible links selectively connect the plurality of capacitors to one another and selected ones of the capacitors to the contacts. In this manner, for example, the capacitance value can be adjusted to tune an antenna mounted on the substrate during testing of the integrated circuit device.
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Brunnbauer et al., Embedded Wafer Level Ball Grid Array (eWLB), Electronics Packaging Technology Conference, 2006, pp. 1-5.
Beer Thomas
Mio Hannes
Dicke Billig & Czaja, PLLC
Infineon - Technologies AG
Kim Ahshik
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