Integrated circuit device having macro isolation test function

Details Integrated circuit device having macro isolation test function Integrated circuit device having macro isolation test function

1991-11-04

1994-11-08

Beausoliel, Jr., Robert W.

Excavating

324 731, 3241581, H04B 1700

Patent

active

053633814

ABSTRACT:
An integrated circuit device comprises a mega-macro(s) and an interface block section. At least one of the mega-macro and the interface block section comprises a switching circuit for switching a mode between a test mode and a normal mode and two sets of individual dedicated terminals which are valid in the normal mode and the test mode, respectively, and serve to transfer signals to/from an internal circuit. In such an arrangement, an mega-macro isolation test can be simplified and also a designer can design the circuit in a normal mode with no consciousness of the presence of a test circuit thereby making it easy to analyze and debug the circuit, so that the burden of test designing for a designer can be removed thereby to shorten the time needed for developing the integrated circuit device.

REFERENCES:
patent: 4837765 (1989-06-01), Suzuki
patent: 5027183 (1991-06-01), Dreps
patent: 5101153 (1992-03-01), Morong, III
patent: 5103167 (1992-04-01), Okano et al.
patent: 5153509 (1992-10-01), Dalrymple et al.
patent: 5161159 (1992-11-01), McClure et al.
"Direct Access Test Scheme-Design of Block and Core Cells for Embedded Asics" V. Immaneni et al, Sep. 1990 IEEE pp. 488-492.

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