Integrated circuit device comprising a plurality of functional m

Details Integrated circuit device comprising a plurality of functional m Integrated circuit device comprising a plurality of functional m

1997-01-27

1999-06-08

Le, Dieu-Minh

Excavating

39518303, 395311, 371 2231, 371 2234, G06F 11267, G06F 1127

Patent

active

059110392

ABSTRACT:
An integrated circuit device is structured by a plurality of functional modules (2a, 2b) each performing a predetermined function, each functional module including a test circuit (3) for testing the corresponding module. Each test circuit comprises a scan path (3a-3d) for receiving test data from a single common input line to perform a test and outputting a test output, a tri-state buffer (4a) for controlling an output of the test output from the scan path to a single common output line, and a scan path selecting circuit (5a) for selectively driving the tri-state buffer. All the selecting circuits in the integrated circuit device are connected in series to constitute as a whole a shift register. A selecting signal of the serial data is inputted to the shift register, so that the test output of each scan path is selectively supplied to the common output line.

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