1985-08-26
1987-10-20
Atkinson, Charles E.
Excavating
324 73R, 371 15, G01R 3128
Patent
active
047019220
ABSTRACT:
An integrated circuit device comprises combinational circuits and sequential circuits. Each of the sequential circuits is provided with a (common) input control signal terminal for controlling the entry of main input terminal signals into the sequential circuit, a test data input/output terminal, a read/write signal terminal for controlling the transfer of the test data, and a latch circuit. The integrated circuit device is partitioned into sequential circuit groups, and combinational circuit groups used as partitioning test units, the main input/output terminal groups of which are connected with the sequential circuit groups through wiring layers. Test data are written into and read out from the sequential circuit groups under control of read/write signal lines through bus lines dedicated to testing. Thus, a higher fault-coverage ratio can be easily obtained with a smaller number of steps and a small test circuit area.
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Hayashi Terumine
Kuboki Shigeo
Masuda Ikuro
Masuda Toshiaki
Atkinson Charles E.
Hitachi , Ltd.
Hitachi Engineering Co. Ltd.
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