Integrated circuit burn-in test system and associated methods

Details Integrated circuit burn-in test system and associated methods Integrated circuit burn-in test system and associated methods

2007-02-27

2007-02-27

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

11034567

ABSTRACT:
An integrated circuit burn-in test system includes an integrated circuit and a tester. The integrated circuit includes operating circuitry, a heater for heating the operating circuitry, and burn-in test circuitry for testing the operating circuitry while being heated. A package surrounds the operating circuitry, the heater and the burn-in test circuitry. The burn-in test circuitry causes the operating circuitry to operate and generate data related thereto. The tester receives data from the burn-in test circuitry. The heater may be configured within the package to heat at least one predetermined portion of the operating circuitry.

REFERENCES:
patent: 5309090 (1994-05-01), Lipp
patent: 6060895 (2000-05-01), Soh et al.
patent: 6329642 (2001-12-01), Kaneko et al.
patent: 6433567 (2002-08-01), Okayasu
patent: 6437590 (2002-08-01), Tatsumi
patent: 6552560 (2003-04-01), Melgaard et al.
patent: 6636062 (2003-10-01), Gaasch et al.

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