Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1990-08-13
1992-07-14
Karlsen, Ernest F.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
371 221, G01R 3128
Patent
active
051306450
ABSTRACT:
A built-in, self-test structure for the circuit components of an integrated circuit chip is isolated from the chip circuitry and the operating power supply and power supply interconnections of the chip, so that it appears as an open circuit during normal operation of the chip. The self-test structure includes separate power supply leads for connection to a separate test power supply which is employed to both enable and operate the circuit in the test mode. The test input are multiplexed on the test power supply leads while test power is applied thereto. Whenever the test power is removed, the test circuit automatically powers down and disconnects, essentially becoming invisible to the normal operation of the circuit. If short circuits or circuit opens should occur in the test structures, the reliability of the operation of the integrated circuit device itself is unaffected, since the test circuit structures are isolated from the operating circuit components of the integrated circuit chip.
REFERENCES:
patent: 4336495 (1982-06-01), Hapke
patent: 4686627 (1987-08-01), Donovan et al.
patent: 4743841 (1988-05-01), Takeuchi
patent: 4970454 (1990-11-01), Stambaugh et al.
Karlsen Ernest F.
Ptak LaValle D.
VLSI Technology Inc.
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